EDN

Pickering fault-insertion modules aid automotive test

Joining Pickering Interfaces' family of PXI-based fault-insertion modules are two units that provide a compact solution for simulating both high-current and low-current faults when testing control ...
Electronic Design

Using PXI-based Fault Insertion and Sensor Simulation in Electronic Test

The operation of ECUs is typically verified by using HILS. This replaces the sensors that monitor the ECU’s real-world environment with electronic simulators. Automate this fault testing for a quick ...
EDN

Multichannel PXI switches perform fault insertion

Pickering’s latest PXI switch modules, the 40-200 and 40-201, allow the introduction of fault connections for testing differential serial interfaces. The modules allow manufacturers to simulate ...
Electronic Design

Pickering Interfaces expands PCI fault insertion switch range

Clacton-on-Sea, UK. Pickering Interfaces announced it is expanding its range of PCI fault insertion switching products with the introduction of two new modules (models 50-200 and 50-201) designed for ...
New Electronics

Pickering unveils MEMS-based MultiGBASE-T1 fault insertion units

Pickering Interfaces has unveiled a major new addition to its extensive range of PXI FIU (fault insertion unit) switch modules. Available in a compact single-slot form factor, the new models - the ...
Semiconductor Engineering

Complex Heterogeneous Integration Drives Innovation In Semiconductor Test

Heterogeneous integration is driving innovation in the semiconductor industry, but it also introduces more complexity in chip design, which translates to more intricate test requirements. The ...