In this interview, AZoNano speaks with Chris Schwalb about SEM, AFM, and the development and significance of FusionScope in the realm of nanoscale analysis. My name is Chris Schwalb, and I lead the ...

In this interview, industry expert Chris Schwalb provides an overview of the FusionScope®. He explains how this new instrument is transforming correlative microscopy with its innovative AFM-SEM ...

Atomic force microscopy (AFM) is an advanced microscopy technique that enables researchers to characterize the surface features of nanoparticles as small as 6 nm across. Image Credit: sanjaya viraj ...

The technique is non-invasive and non-destructive and enables the measurement of the surface topography of a sample by tracing the sample surface with an ultra-sharp probe attached to a soft ...