Atomic force microscopy (AFM) has evolved into an indispensable tool for nanoscale investigation, enabling detailed imaging and quantification of surface topography as well as mechanical properties.

One variation of electron microscopy is transmission electron microscopy (TEM). In a TEM experiment, the electron beam passes through the sample and the electrons are directly imaged onto an electron ...

Nanomaterials are used in various fields due to their distinct size-dependent properties, and accurate characterization is essential to optimize and design them for specific applications. 1 For ...

Integrating deep learning in optical microscopy enhances image analysis, overcoming traditional limitations and improving ...

(A) a single magnetic domain and (B) multiple magnetic domains with opposite polarization. (C) Following the subtraction of image (A) from image (B), a Kerr image with sharp contrast is obtained [39].

Flow Imaging Microscopy (FIM), also referred to as Dynamic Image Analysis (DIA), combines the advantages of traditional particle counters with high-resolution imaging to efficiently and expeditiously ...

Traditionally, analyzing materials involved techniques tailored for specific scales, which made integrating data from these different methods quite challenging. However, recent advancements in ...

The objective of this course is to develop broad knowledge of the most commonly used techniques for characterizing soft and hard materials, with a strong focus on microscopy techniques. This is a ...

Researchers at Istituto Italiano di Tecnologia (IIT-Italian Institute of Technology) have developed an innovative microscopy technique capable of improving the observation of living cells. The study, ...

Unprecedented views of the interior of cells and other nanoscale structures are now possible thanks to innovations in expansion microscopy. The advancements could help provide future insight into ...

For human researchers, it takes many years of work to discover new super-resolution microscopy techniques. The number of possible optical configurations of a microscope -- for example, where to place ...