Acceptance sampling plans and reliability testing constitute fundamental tools for ensuring product quality and performance. These methodologies allow manufacturers and researchers to assess a lot’s ...

One-shot devices, which are engineered for one-time use and are often subject to destructive testing, represent an important class of critical components in areas ranging from aerospace to biomedical ...

Suppliers of gallium nitride (GaN) and silicon carbide (SiC) power devices are rolling out the next wave of products with some new and impressive specs. But before these devices are incorporated in ...

The U.S. Department of Energy (DOE) has recently released test results and conclusions from its ongoing reliability testing conducted on solid-state lighting (SSL) drivers, LED packages, and OLEDs.

There is a great deal of activity in wide bandgap (WBG) power electronics lately, with Gallium Nitride (GaN) and Silicon Carbide (SiC) devices getting a lot of attention due to the technologies’ ...

Journal of Reliability Science and Engineering will be published by IOP Publishing and the Institute of Systems Engineering of China Academy of Engineering Physics Journal of Reliability Science and ...

Experts at the Table: Semiconductor Engineering sat down to discuss reliability of chips, how it is changing, and where the new challenges are, with Steve Pateras, vice president of marketing and ...