Abstract: Graphs are effective tools for modeling complex data. Setting out from two basic substructures, random walks and trees, we propose a new family of context-dependent random walk graph kernels ...
Abstract: Local defect patterns (LDP) in wafer maps are usually induced by problems in the manufacturing process. Therefore, defect pattern recognition is useful for root cause analysis, which is very ...
This is a sample Personal Finance Manager application demonstrating an end-to-end Plaid integration, focused on linking items and fetching transaction data. You can ...
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